High-throughput nanopore-FET array readout IC with 5-MHz bandwidth and background offset/drift calibration

A. Das, Q. Lin, S. Santermans, L. Liu, C. Van Hoof, G. G. Gielen, N. Van Helleputte
January 2023
Type
Journal Article
Publication
IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 70, no. 11, pp. 4323-4333