Static and Statistical Modeling of LTPS TFTS for Robust Analog Design: Verified Through Amplifier and Comparator Measurements

X. Xing, S. M. S. Faramarzi, F. De Roose, F. Berghmans, Q. Lin, C. Wang, H. Celiker, R. Appeltans, J. Genoe
January 2025
Type
Conference Paper
Publication
2025 IEEE European Solid-State Electronics Research Conference (ESSERC), pp. 173-176