High-throughput nanopore-FET array readout IC with 5-MHz bandwidth and background offset/drift calibration

A. Das, Q. Lin, S. Santermans, L. Liu, C. Van Hoof, G. G. Gielen, N. Van Helleputte
一月 2023
类型
期刊论文
出版物
IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 70, no. 11, pp. 4323-4333