Static and Statistical Modeling of LTPS TFTS for Robust Analog Design: Verified Through Amplifier and Comparator Measurements

X. Xing, S. M. S. Faramarzi, F. De Roose, F. Berghmans, Q. Lin, C. Wang, H. Celiker, R. Appeltans, J. Genoe
一月 2025
类型
会议论文
出版物
2025 IEEE European Solid-State Electronics Research Conference (ESSERC), pp. 173-176